BEEM: Sanning Electron Microscopes (SEM)

BEEM > Devices and Methods > Sanning Electron Microscopes (SEM)

Our Scanning Electron Microscopes

1. Zeiss Supra VP 55

The Zeiss Supra VP 55 is a field emission gun (FEG) scanning electron microscope (SEM) with high resolution and a "Variable Pressure" mode (VP). In addition to an EDX detector for element analysis, it is equipped with a wavelength-dispersive X-ray spectrometer (WDX) and an EBSD (Electron Backscatter Diffraction) detector.

Learn more about the Zeiss Supra VP 55

Location and Device Managers

Location: Building H in room -1.24D, phone: -4855

1. Device Manager: Jens Timmermann, phone: -4575

2. Device Manager (1. Substitute): Andrea Bluhm, phone: -4881

2. Leo 1530

The Leo 1530 is a field emission gun (FEG) scanning electron microscope (SEM) with high resolution. Besides an EDX detector for element analysis, it features a specialized backscatter detector that enables 3D reconstructions of the sample surface.

Learn more about the Leo 1530

Location and device managers

Location: Building M in room 3526, phone: -2320

1. Device Manager: Andrea Bluhm, phone: -4881

2. Device Manager: Dagmar Rings, phone: -3092

Important Links:

Booking- and Accounting System for Electron Microscopy (BASE) . BASE is an in-house development by BEEM and is used for online appointment booking and project-related billing of the costs incurred.

In our BEEM Wiki you will find information about our microscopes and methods.

e-Zeit Hamburg - TUHH Working time recording system

TU Hamburg

Technical University Hamburg

Electron Microscopy Unit (BEEM)

Eißendorfer Straße 42

21073 Hamburg

E-mail : beem@tuhh.de

Phone : ++49 40 42878 3544