Expected to be available from April 2025

Technical Details

The Quattro S from FEI (Thermo Fisher) is a special scanning electron microscope (SEM) that enables the examination of samples under variable pressure environments and gas atmospheres. It is therefore also referred to as an "environmental" scanning electron microscope. However, the English term "Environmental Scanning Microscope" or ESEM for short has also become common in German.
The advantage of ESEMs is that quasi in-situ examinations of samples are possible, whereby the environmental conditions of the samples can be adjusted to a certain extent by varying the pressure (up to 4000 Pa) and atmospheric conditions. Furthermore, samples that are not or only slightly electrically conductive can also be examined.
The Quattro S can also be used as a "normal" SEM under high vacuum conditions, whereby it can achieve an excellent resolution of 1 nm at 30 kV acceleration voltage.

Other features of our Quattro S are:

STEM (Scanning Transmission Electron Microscopy) module “STEM 3+”
The STEM 3+ module makes it possible to irradiate extra thin samples. This allows the internal structure of samples to be examined with a very high resolution (up to 0.8 nm at 30 kV acceleration voltage).

EBSD (Electron Backscatter Diffraction) “Quasar II”
The EBSD detector “Quasar II” enables the determination of the crystallographic orientation, phase distribution and texture of the sample being examined by recording patterns of the electrons scattered back or, better, forward from the sample.

EDX (EDS) Energy dispersive X-ray microanalysis
Like all of our electron microscopes, the Quattro S is also equipped with an EDX (EDS) detector that enables the determination of the elemental composition of the samples.

The Quattro S is a very versatile electron microscope with the features described above, which enables the examination of a wide range of sample properties. It is particularly suitable for electrically non-conductive samples and/or sensitive samples.