- Leica EM RES102 The unique ion beam milling system combines the preparation of TEM, SEM and LM samples in one single benchtop unit, Contact:Tobias Krekeler, Tel.: -4667.
- Leica EM TXP
(Building M, Room 2556, Contact: Lida Wang, Tel.: -4574)
- Sputter Coater SCD 050 by Baltec
(Building M, Room 3526, Contact: Tobias Krekeler, Tel.: -4667)
- Struers TenuPol-3
(Building M, Room 2549, Contact: Lida Wang, Tel.: -4574)