We warmly congratulate Trushal on this.
Trushal's work contributes significantly to improving the three-dimensional reconstruction of nanomaterials using FIB-SEM tomography. Until now, this methodology has reached its limits, particularly due to the shine-through effect and ambiguity in image intensity.
With the help of machine learning, Trushal was able to overcome this quality limitation. In Trushal's new approach, the shine-through effect is no longer an obstacle, but is even used as an additional source of information. Trushal's work sets new standards for the quality and efficiency of characterizing micro- and nanostructures in materials science.
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