23.04.2025

SPIE Defense + Commercial Sensing Conference in Orlando, FL

[Translate to English:]
[Translate to English:]
[Translate to English:]

We are very pleased that our research associate Ole Günter Schmedemann was present at the SPIE Defense + Commercial Sensing Conference in Orlando, FL!

As part of the session “Synthetic Data for Artificial Intelligence and Machine Learning: Tools, Techniques, and Applications III” he presented his paper “Introducing a tool for synthetic defect image data generation: enhancing industrial surface inspection”. His contribution impressively shows how synthetically generated defect images can take industrial surface inspection to the next level.
Many thanks to SPIE for an exciting event and the lively exchange!
   

 

23.04.2025

SPIE Defense + Commercial Sensing Conference in Orlando, FL

[Translate to English:]
[Translate to English:]
[Translate to English:]

We are very pleased that our research associate Ole Günter Schmedemann was present at the SPIE Defense + Commercial Sensing Conference in Orlando, FL!

As part of the session “Synthetic Data for Artificial Intelligence and Machine Learning: Tools, Techniques, and Applications III” he presented his paper “Introducing a tool for synthetic defect image data generation: enhancing industrial surface inspection”. His contribution impressively shows how synthetically generated defect images can take industrial surface inspection to the next level.
Many thanks to SPIE for an exciting event and the lively exchange!