[www] [BibTex]

Note: inproceedings, multi-patch, artifact

Abstract: Magnetic particle imaging determines the spatial distribution of superparamagnetic nanoparticles within a small field-of-view. Multi-patch approaches can expand the field-of-view at the cost of artifacts caused by field imperfections. Time-consuming calibration scans can reduce these displacement artifacts by measuring system matrices for each patch. In this contribution, only one central system matrix is used, which is warped according to the underlying magnetic fields, resulting in low calibration times and higher image quality.

[www]

Note: inproceedings, multi-patch, artifact

Abstract: Magnetic particle imaging determines the spatial distribution of superparamagnetic nanoparticles within a small field-of-view. Multi-patch approaches can expand the field-of-view at the cost of artifacts caused by field imperfections. Time-consuming calibration scans can reduce these displacement artifacts by measuring system matrices for each patch. In this contribution, only one central system matrix is used, which is warped according to the underlying magnetic fields, resulting in low calibration times and higher image quality.

[www] [BibTex]

Note: inproceedings, multi-patch, artifact

Abstract: Magnetic particle imaging determines the spatial distribution of superparamagnetic nanoparticles within a small field-of-view. Multi-patch approaches can expand the field-of-view at the cost of artifacts caused by field imperfections. Time-consuming calibration scans can reduce these displacement artifacts by measuring system matrices for each patch. In this contribution, only one central system matrix is used, which is warped according to the underlying magnetic fields, resulting in low calibration times and higher image quality.

[www]

Note: inproceedings, multi-patch, artifact

Abstract: Magnetic particle imaging determines the spatial distribution of superparamagnetic nanoparticles within a small field-of-view. Multi-patch approaches can expand the field-of-view at the cost of artifacts caused by field imperfections. Time-consuming calibration scans can reduce these displacement artifacts by measuring system matrices for each patch. In this contribution, only one central system matrix is used, which is warped according to the underlying magnetic fields, resulting in low calibration times and higher image quality.

[www]

Note: inproceedings, multi-patch, artifact

Abstract: Magnetic particle imaging determines the spatial distribution of superparamagnetic nanoparticles within a small field-of-view. Multi-patch approaches can expand the field-of-view at the cost of artifacts caused by field imperfections. Time-consuming calibration scans can reduce these displacement artifacts by measuring system matrices for each patch. In this contribution, only one central system matrix is used, which is warped according to the underlying magnetic fields, resulting in low calibration times and higher image quality.

[www] [BibTex]

Note: inproceedings, multi-patch, artifact

Abstract: Magnetic particle imaging determines the spatial distribution of superparamagnetic nanoparticles within a small field-of-view. Multi-patch approaches can expand the field-of-view at the cost of artifacts caused by field imperfections. Time-consuming calibration scans can reduce these displacement artifacts by measuring system matrices for each patch. In this contribution, only one central system matrix is used, which is warped according to the underlying magnetic fields, resulting in low calibration times and higher image quality.