Techniques for Characterizing Waveguide Gratings and Grating-Based Devices

Techniques for Characterizing Waveguide Gratings and&nb

E. Brinkmeyer, S. Kieckbusch, F. Knappe,
Techniques for Characterizing Waveguide Gratings and Grating-Based Devices
Photonics North, Québec City, Canada, 5-8 June; Proc. SPIE 6343, p. 63431U (2006)

Abstract: Waveguide gratings used in laser technology, optical sensing or optical communications have to serve different specific purposes and, hence, have to have specific optical properties which can be tailored to a large extent. Characterization methods are required not only to measure the actual effect of a Bragg grating or long period grating under consideration but also to unveil the cause, i.e. to determine its spatial structure. This paper reviews the present status of the respective experimental characterization techniques. The methods emphasized rely on phase sensitive reflectometry together with advanced inverse scattering evaluation algorithms.

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